Characterization of field emission from oxidized copper emitters

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26620%2F24%3APU152192" target="_blank" >RIV/00216305:26620/24:PU152192 - isvavai.cz</a>

Alternative codes found

RIV/68081723:_____/24:00598408

Result on the web

<a href="https://iopscience.iop.org/article/10.1088/1402-4896/ad7232" target="_blank" >https://iopscience.iop.org/article/10.1088/1402-4896/ad7232</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1088/1402-4896/ad7232" target="_blank" >10.1088/1402-4896/ad7232</a>

Result language

angličtina

Original language name

Characterization of field emission from oxidized copper emitters

Original language description

In this work, the field electron emission from oxidized copper emitters was studied by aging with radii in the range of 80-300 nm. The samples were prepared by an electrochemical etching method using an H3PO4 solution. The samples were exposed to air for 30 d to form an oxide film owing to aging. Measurements were carried out under high vacuum conditions in the range of 10-6 mbar. Scanning electron microscopy-energy dispersive X-ray spectroscopy (SEM- EDS) was used to calculate the emitter radius, study the purity of the samples, and detect the oxide layers. Current-voltage (I-V) characteristics were studied and analyzed using Murphy-Goode (MG) plots and rectification tests. Furthermore, the spatial distribution of the electron emission and current stability were recorded and used to analyze the electron emission behavior of the tip surface. The trap density was also studied when the oxide layer was 3 layers thick. The results show that the emitters passed the orthodoxy test at low voltages. It was found that traps play an important role in increasing the switch-on current as the area of the oxide layer increases. It was found that the emitter acts as a point capacitor based on the charging and discharging processes of the electrons in the traps. The emission pattern showed great stability, which opens up prospects for this type of emitter in industry.

Czech name

—

Czech description

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Type

J_imp - Article in a specialist periodical, which is included in the Web of Science database

CEP classification

—

OECD FORD branch

10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Project

—

Continuities

S - Specificky vyzkum na vysokych skolach

Publication year

2024

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

PHYSICA SCRIPTA

ISSN

0031-8949

e-ISSN

1402-4896

Volume of the periodical

99

Issue of the periodical within the volume

10

Country of publishing house

SE - SWEDEN

Number of pages

14

Pages from-to

„“-„“

UT code for WoS article

001308298300001

EID of the result in the Scopus database

2-s2.0-85203630001