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Characterization of Electron Emission from Broad Area Composite Emitter

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F24%3APU155930" target="_blank" >RIV/00216305:26220/24:PU155930 - isvavai.cz</a>

  • Result on the web

    <a href="https://ieeexplore.ieee.org/abstract/document/10652461" target="_blank" >https://ieeexplore.ieee.org/abstract/document/10652461</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/IVNC63480.2024.10652461" target="_blank" >10.1109/IVNC63480.2024.10652461</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Characterization of Electron Emission from Broad Area Composite Emitter

  • Original language description

    This work studies the emission of electrons from Copper Broad Area Emitter (CBAE) in addition to Copper Broad Area Composite Emitter (CBACE) and provides an explanation of the switch-on phenomenon based on the formation of conductive channels and traps. The samples were examined using field electron microscopy (FEM) at high vacuum conditions (10(-6) mbar) and a voltage of 15 kV, with the emitter placed 5 mm away from the anode. Scanning electron microscopy (SEM) was used to characterise the epoxy layer after voltage application. The results based on current and voltage characteristics showed that a breakdown of the epoxy layer occurred due to the emission of current at 13 kV.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

  • OECD FORD branch

    21000 - Nano-technology

Result continuities

  • Project

    <a href="/en/project/GA23-07384S" target="_blank" >GA23-07384S: Back-gated few-layers graphene gas sensors: charge transport and its fluctuation used for performance improvement</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2024

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    International Vacuum Nanoelectronics Conference

  • ISBN

    979-8-3503-7976-1

  • ISSN

    2164-2370

  • e-ISSN

  • Number of pages

    2

  • Pages from-to

    1-2

  • Publisher name

    IEEE

  • Place of publication

    NEW YORK

  • Event location

    Brno

  • Event date

    Jul 15, 2024

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article

    001310530600054