Effect of traps and conductive pathways on electron emission from copper broad-area composite emitters

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081723%3A_____%2F24%3A00602566" target="_blank" >RIV/68081723:_____/24:00602566 - isvavai.cz</a>

Alternative codes found

RIV/68081731:_____/24:00602566 RIV/00216305:26220/24:PU155403

Result on the web

<a href="https://iopscience.iop.org/article/10.1088/1402-4896/ad80df" target="_blank" >https://iopscience.iop.org/article/10.1088/1402-4896/ad80df</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1088/1402-4896/ad80df" target="_blank" >10.1088/1402-4896/ad80df</a>

Result language

angličtina

Original language name

Effect of traps and conductive pathways on electron emission from copper broad-area composite emitters

Original language description

This study investigates electron emission from copper broad-area emitters (CBAEs) and copper broad-area composite emitters (CBACEs) based on the principles of trapping and conductive pathways. Emission current measurements were conducted on two CBACEs, which consisted of copper coated with a 300-400 mu m epoxy resin and subjected to high voltages up to 15 kV. The research specifically examines the switch-on and collapse phenomena occurring within the epoxy layer. Field emission microscopy (FEM) was utilized in a high-vacuum environment ( 10-6 mbar) to observe these effects. A comprehensive model is developed to explain the formation of conductive pathways within the epoxy layer, allowing electrons transfer from traps to the surface. This model treats the composite emitter as a trap-rich capacitor. The study also clarifies the effects of trap density and epoxy layer thickness on the collapse process. To gain a deeper understanding of the model, changes in the I-V curve were examined. Simulations, scanning electron microscopy-energy dispersive x-ray spectroscopy (SEM-EDX) images, and Fourier transform infrared spectroscopy (FTIR) analysis were employed to understand the collapse mechanism of the epoxy collapse. Additionally, Nyquist and Cole-Cole plots were analyzed across frequencies ranging from 1 to 106 Hz before and after applying a high electric field on the samples, revealing changes in the capacitive component and the role of diodes in the formation of conductive channels.

Czech name

—

Czech description

—

Type

J_imp - Article in a specialist periodical, which is included in the Web of Science database

CEP classification

—

OECD FORD branch

10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Project

<a href="/en/project/LM2023051" target="_blank" >LM2023051: Research infrastructure CzechNanoLab</a><br>

Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2024

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Physica Scripta

ISSN

0031-8949

e-ISSN

1402-4896

Volume of the periodical

99

Issue of the periodical within the volume

11

Country of publishing house

GB - UNITED KINGDOM

Number of pages

16

Pages from-to

116101

UT code for WoS article

001333854300001

EID of the result in the Scopus database

2-s2.0-85207066121