Simulation Study of Low-Dose 4D-STEM Phase Contrast Techniques at the Nanoscale in SEM
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F25%3A00604707" target="_blank" >RIV/68081731:_____/25:00604707 - isvavai.cz</a>
Result on the web
<a href="https://www.mdpi.com/2079-4991/15/1/70" target="_blank" >https://www.mdpi.com/2079-4991/15/1/70</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.3390/nano15010070" target="_blank" >10.3390/nano15010070</a>
Alternative languages
Result language
angličtina
Original language name
Simulation Study of Low-Dose 4D-STEM Phase Contrast Techniques at the Nanoscale in SEM
Original language description
Phase contrast imaging is well-suited for studying weakly scattering samples. Its strength lies in its ability to measure how the phase of the electron beam is affected by the sample, even when other imaging techniques yield low contrast. In this study, we explore via simulations two phase contrast techniques: integrated center of mass (iCOM) and ptychography, specifically using the extended ptychographical iterative engine (ePIE). We simulate the four-dimensional scanning transmission electron microscopy (4D-STEM) datasets for specific parameters corresponding to a scanning electron microscope (SEM) with an immersive objective and a given pixelated detector. The performance of these phase contrast techniques is analyzed using a contrast transfer function. Simulated datasets from a sample consisting of graphene sheets and carbon nanotubes are used for iCOM and ePIE reconstructions for two aperture sizes and two electron doses. We highlight the influence of aperture size, showing that for a smaller aperture, the radiation dose is spent mostly on larger sample features, which may aid in imaging sensitive samples while minimizing radiation damage.
Czech name
—
Czech description
—
Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
—
OECD FORD branch
20201 - Electrical and electronic engineering
Result continuities
Project
<a href="/en/project/GA21-13541S" target="_blank" >GA21-13541S: Quantitative low energy 4D-STEM imaging of beam sensitive samples</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2025
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Nanomaterials
ISSN
2079-4991
e-ISSN
2079-4991
Volume of the periodical
15
Issue of the periodical within the volume
1
Country of publishing house
CH - SWITZERLAND
Number of pages
15
Pages from-to
70
UT code for WoS article
001393814800001
EID of the result in the Scopus database
2-s2.0-85214526952