The Cutting of Ultrathin Sections With the Thickness Less Than 20 nm From Biological Specimens Embedded in Resin Blocks
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378050%3A_____%2F16%3A00463327" target="_blank" >RIV/68378050:_____/16:00463327 - isvavai.cz</a>
Alternative codes found
RIV/60077344:_____/16:00463327 RIV/68081731:_____/16:00463327 RIV/60076658:12310/16:43890647 RIV/00216208:11310/16:10371534
Result on the web
<a href="http://dx.doi.org/10.1002/jemt.22659" target="_blank" >http://dx.doi.org/10.1002/jemt.22659</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1002/jemt.22659" target="_blank" >10.1002/jemt.22659</a>
Alternative languages
Result language
angličtina
Original language name
The Cutting of Ultrathin Sections With the Thickness Less Than 20 nm From Biological Specimens Embedded in Resin Blocks
Original language description
Low voltage electron microscopes working in transmission mode, like LVEM5 (Delong Instruments, Czech Republic) working at accelerating voltage 5 kV or scanning electron microscope working in transmission mode with accelerating voltage below 1 kV, require ultrathin sections with the thickness below 20 nm. Decreasing of the primary electron energy leads to enhancement of image contrast, which is especially useful in the case of biological samples composed of elements with low atomic numbers. As a result treatments with heavy metals, like post-fixation with osmium tetroxide or ultrathin section staining, can by omitted. The disadvantage is reduced penetration ability of incident electrons influencing the usable thickness of the specimen resulting in the need of ultrathin sections of under 20 nm thickness. In this study we want to answer basic questions concerning the cutting of extremely ultrathin sections: Is it possible routinely and reproducibly to cut extremely thin sections of biological specimens embedded in commonly used resins with contemporary ultramicrotome techniques and under what conditions?
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/TE01020118" target="_blank" >TE01020118: Electron microscopy</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2016
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Microscopy Research Technique
ISSN
1059-910X
e-ISSN
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Volume of the periodical
79
Issue of the periodical within the volume
6
Country of publishing house
US - UNITED STATES
Number of pages
6
Pages from-to
512-517
UT code for WoS article
000377025900007
EID of the result in the Scopus database
2-s2.0-84962815318