Optical refraction index and electric polarization profile of ferroelectric thin films.

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F00%3A02010133" target="_blank" >RIV/68378271:_____/00:02010133 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Optical refraction index and electric polarization profile of ferroelectric thin films.

Original language description

The calculations of electric polarization and optical refraction index in ferroelectric thin films are performed in the framework of thermodynamic theory. The solution of Euler-Lagrange equation with given polarizations on the film surfaces (boundary conditions) made it possible to obtain thickness dependence of inhomogenous polarization.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

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Project

<a href="/en/project/LN00A015" target="_blank" >LN00A015: Research center for optics</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2000

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Jemná mechanika a optika

ISSN

0447-6441

e-ISSN

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Volume of the periodical

11

Issue of the periodical within the volume

N/A

Country of publishing house

CZ - CZECH REPUBLIC

Number of pages

5

Pages from-to

338-342

UT code for WoS article

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EID of the result in the Scopus database

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