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Optical refraction index and electric polarization profile of ferroelectric thin films.

Result description

The calculations of electric polarization and optical refraction index in ferroelectric thin films are performed in the framework of thermodynamic theory. The solution of Euler-Lagrange equation with given polarizations on the film surfaces (boundary conditions) made it possible to obtain thickness dependence of inhomogenous polarization.

Keywords

ferroelectric thin filmselectric polarizationopticalrefractive indexthermodynamic theory

The result's identifiers

Alternative languages

  • Result language

    angličtina

  • Original language name

    Optical refraction index and electric polarization profile of ferroelectric thin films.

  • Original language description

    The calculations of electric polarization and optical refraction index in ferroelectric thin films are performed in the framework of thermodynamic theory. The solution of Euler-Lagrange equation with given polarizations on the film surfaces (boundary conditions) made it possible to obtain thickness dependence of inhomogenous polarization.

  • Czech name

  • Czech description

Classification

  • Type

    Jx - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

Others

  • Publication year

    2000

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Jemná mechanika a optika

  • ISSN

    0447-6441

  • e-ISSN

  • Volume of the periodical

    11

  • Issue of the periodical within the volume

    N/A

  • Country of publishing house

    CZ - CZECH REPUBLIC

  • Number of pages

    5

  • Pages from-to

    338-342

  • UT code for WoS article

  • EID of the result in the Scopus database