XPS study of siloxane plasma polymer films.
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F03%3A02030552" target="_blank" >RIV/68378271:_____/03:02030552 - isvavai.cz</a>
Alternative codes found
RIV/00216305:26310/03:PU38780
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
XPS study of siloxane plasma polymer films.
Original language description
The composition of elements in the surface region (top 6-8 nm) of the deposited films was studied by X-ray-induced photoelectron spectroscopy(XPS) on an ADES 400 VG Scientific photoelectron spectrometer using MgK .alfa. (1253.6 eV) or AlK .alfa. (1486.6eV) photon beams at the normal emiaaion angle.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2003
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Surface and Coatings Technology
ISSN
0257-8972
e-ISSN
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Volume of the periodical
174-175
Issue of the periodical within the volume
N/A
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
5
Pages from-to
1159-1163
UT code for WoS article
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EID of the result in the Scopus database
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