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XUV-laser induced ablation of PMMA with nano-, pico-, and femtosecond pulses

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F05%3A00025721" target="_blank" >RIV/68378271:_____/05:00025721 - isvavai.cz</a>

  • Alternative codes found

    RIV/00216208:11320/05:00005501

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    XUV-laser induced ablation of PMMA with nano-, pico-, and femtosecond pulses

  • Original language description

    For conventional wavelength (UV-vis-IR) lasers delivering radiation energy to the surface of materials, ablation thresholds, etch (ablation) rates, and the quality of ablated structures often differ dramatically between short (typically nanosecond) and ultrashort (typically femtosecond) pulses. Various very short-wavelength (?<100 nm) lasers, emitting pulses with durations ranging from ~ 10 fs to ~1 ns, have recently been placed into routine operation, this has facilitated the investigation of how ablation characteristics depend on the pulse duration in the XUV spectral region

  • Czech name

    Ablace PMMA indukovaná nano-, piko- a femtosekundovými impulzy XUV laserů

  • Czech description

    Pro běžné dlouhovlnné (UV-vis-NIR) lasery závisí ablační charakteristiky velmi výrazně na tom, zda je záření na povrch materiálu směrováno v krátkých (typicky nanosekundových) či velmi krátkých (typicky femtosekundových) impulzech. V této práci se pokoušíme odpovědět na otázku, zda toto platí i pro lasery pracující v extrémním ultrafialovém (XUV) oboru

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BH - Optics, masers and lasers

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2005

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Journal of Electron Spectroscopy and Related Phenomena

  • ISSN

    0368-2048

  • e-ISSN

  • Volume of the periodical

    144-147

  • Issue of the periodical within the volume

    -

  • Country of publishing house

    NL - THE KINGDOM OF THE NETHERLANDS

  • Number of pages

    4

  • Pages from-to

    929-932

  • UT code for WoS article

  • EID of the result in the Scopus database