Characterization of mixed phase silicon by Raman spectroscopy
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F06%3A00040680" target="_blank" >RIV/68378271:_____/06:00040680 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Characterization of mixed phase silicon by Raman spectroscopy
Original language description
We have examined the common methods for determination of the crystallinity. Crystallinity values obtained from Raman spectra excited by Ar+ laser green line (514.5 nm) for a special sample with a profile of structure from amorphous to fully microcrystalline
Czech name
Charakterizace směsné fáze křemíku pomocí Ramanovy spektroskopie
Czech description
Práce se věnuje ověření hodnot krystalinity z Ramanovské spektroskopie a popisuje úskalí měření při standardním buzení 514.5 nm
Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2006
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Journal of Non-Crystalline Solids
ISSN
0022-3093
e-ISSN
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Volume of the periodical
352
Issue of the periodical within the volume
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Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
4
Pages from-to
1209-1212
UT code for WoS article
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EID of the result in the Scopus database
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