Similarities and differences between spatial coherence profilometry and white-light interferometry
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F10%3A00355851" target="_blank" >RIV/68378271:_____/10:00355851 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Similarities and differences between spatial coherence profilometry and white-light interferometry
Original language description
Spatial coherence profilometry is a method that uses a Michelson interferometer illuminated by a quasi-monochromatic spatially extended light source to measure the shape of objects. Because of the spatially extended light source, this method takes advantage of spatial coherence of the light. Thus spatial coherence profilometry appears to be a spatial coherence analogy to white-light interferometry which is a reliable and proved method for the measurement of the shape of objects. White-light interferometry usually uses a Michelson interferometer illuminated by a polychromatic point-like light source and so is based on temporal coherence. Though these both measurement methods look similar they show some significant differences. By means of theoretical analysis and experiments we investigate what is similar and where are the differences between these both methods.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
BH - Optics, masers and lasers
OECD FORD branch
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Result continuities
Project
<a href="/en/project/KAN301370701" target="_blank" >KAN301370701: Nanostructured Macroscopic Systems - Technology and Characterisation</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2010
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Similarities and Differences between Spatial Coherence Profilometry and White-light Interferometry
ISBN
978-0-7354-0783-1
ISSN
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e-ISSN
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Number of pages
6
Pages from-to
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Publisher name
AIP
Place of publication
Melville, New York
Event location
Ascona
Event date
May 16, 2010
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000283749400027