Fourier transform photocurrent measurement of thin silicon films on rough, conductive and opaque substrates
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F10%3A00366182" target="_blank" >RIV/68378271:_____/10:00366182 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1002/pssa.200982890" target="_blank" >http://dx.doi.org/10.1002/pssa.200982890</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1002/pssa.200982890" target="_blank" >10.1002/pssa.200982890</a>
Alternative languages
Result language
angličtina
Original language name
Fourier transform photocurrent measurement of thin silicon films on rough, conductive and opaque substrates
Original language description
Fourier transform photocurrent spectroscopy(FTPS)is used as an inspection method for hydrogenated amorphous silicon(a-Si:H)thin ?lms deposited on aluminium foil and aluminium foil coated with rough SnO2. These structures are part of roll-to-roll solar cell fabrication process.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2010
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Physica Status Solidi. A
ISSN
1862-6300
e-ISSN
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Volume of the periodical
207
Issue of the periodical within the volume
9
Country of publishing house
DE - GERMANY
Number of pages
4
Pages from-to
578-581
UT code for WoS article
000276339800017
EID of the result in the Scopus database
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