Fourier transform photocurrent measurement of thin silicon films on rough, conductive and opaque substrates
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F09%3A00338185" target="_blank" >RIV/68378271:_____/09:00338185 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Fourier transform photocurrent measurement of thin silicon films on rough, conductive and opaque substrates
Original language description
Fourier transform photocurrent spectroscopy (FTPS) is used as an inspection method for thin films of hydrogenated amorphous silicon deposited on aluminium foil and aluminium foil coated with rough SnO2. These structures are part of roll-to-roll solar cell fabrication process. Measurement technique utilizes transparent electrode in a sandwich arrangement. An elaborate calculation procedure is used to correct the measurement for the optical effects in order to obtain spectra of optical absorption coefficient. Correction procedure is based partly on analytical formulae and partly on Monte-Carlo simulations. We compared quality of thin layers deposited by PECVD on glass and aluminium foil with and without rough layer of SnO2. We observed positive effect ofaluminium and SnO2 on layer quality and effect of bandgap shift.
Czech name
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Czech description
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Classification
Type
O - Miscellaneous
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA202%2F09%2F0417" target="_blank" >GA202/09/0417: New non-destructive technique of measurement of I-V curves of monolithic multi-junction solar cells</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2009
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů