Formation of CuIn1xAlxSe2 thin films studied by Raman scattering
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F11%3A00375581" target="_blank" >RIV/68378271:_____/11:00375581 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1016/j.tsf.2011.02.030" target="_blank" >http://dx.doi.org/10.1016/j.tsf.2011.02.030</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.tsf.2011.02.030" target="_blank" >10.1016/j.tsf.2011.02.030</a>
Alternative languages
Result language
angličtina
Original language name
Formation of CuIn1xAlxSe2 thin films studied by Raman scattering
Original language description
CuIn1xAlxSe2 (CIAS) thin films (x=0.06, 0.18, 0.39, 0.64, 0.80 and 1) with thicknesses of approximately 1 ?m were formed by the selenization of sputtered CuInAl precursors and studied via X-ray diffraction, inductively coupled plasma mass spectrometry and micro-Raman spectroscopy at room temperature. Precursor films selenized at 300, 350, 400, 450, 500 and 550 °C were examined via Raman spectroscopy in the range 50?500 cm1 with resolution of 0.3 cm1. Sequential formation of InxSey, Cu2xSe, CuInSe2 (CIS)and CIAS phases was observed as the selenization temperature was increased. Conversion of CIS to CIAS was initiated at 500 °C. For all CuIn1xAlxSe2 products, the A1 phonon frequency varied nonlinearly with respect to the aluminum composition parameter xin the range 172 cm1 to 186 cm1.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Thin Solid Films
ISSN
0040-6090
e-ISSN
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Volume of the periodical
519
Issue of the periodical within the volume
16
Country of publishing house
CH - SWITZERLAND
Number of pages
6
Pages from-to
5329-5334
UT code for WoS article
000292573500003
EID of the result in the Scopus database
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