Local photoconductivity of microcrystalline silicon thin films excited by 442 nm HeCd laser measured by conductive atomic force microscopy
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F12%3A00386854" target="_blank" >RIV/68378271:_____/12:00386854 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1016/j.jnoncrysol.2012.01.015" target="_blank" >http://dx.doi.org/10.1016/j.jnoncrysol.2012.01.015</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.jnoncrysol.2012.01.015" target="_blank" >10.1016/j.jnoncrysol.2012.01.015</a>
Alternative languages
Result language
angličtina
Original language name
Local photoconductivity of microcrystalline silicon thin films excited by 442 nm HeCd laser measured by conductive atomic force microscopy
Original language description
Microcrystalline silicon (?c-Si:H) thin films were studied by photo-conductive atomic force microscopy (PC-AFM) under top side illumination by HeCd 442 nm laser and/or by scattered light of AFM detection diode. In order to make the top side illuminationpossible, so called ?nose type cantilevers, with the tip at the end of cantilever, were used for local photo-current map measurements. Local current intensity under different illumination is discussed mainly from a point of view of the absorption depth of the used light. Diffusion length of charge carriers 300 nm was estimated from comparison of the current levels under different illumination.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Journal of Non-Crystalline Solids
ISSN
0022-3093
e-ISSN
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Volume of the periodical
358
Issue of the periodical within the volume
17
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
5
Pages from-to
2082-2085
UT code for WoS article
000310394700037
EID of the result in the Scopus database
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