Charge diffusion measurement in fully depleted CCD using X-rays

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F12%3A00387619" target="_blank" >RIV/68378271:_____/12:00387619 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1016/j.nima.2011.11.027" target="_blank" >http://dx.doi.org/10.1016/j.nima.2011.11.027</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.nima.2011.11.027" target="_blank" >10.1016/j.nima.2011.11.027</a>

Result language
angličtina
Original language name
Charge diffusion measurement in fully depleted CCD using X-rays
Original language description
Tight requirements on the Large Synoptic Survey Telescope point spread function (PSF) demand sensor contribution to PSF be both small and well characterized. The sensor PSF is determined by the lateral charge diffusion on the drift path from the CCD window to the gates. Different techniques for charge diffusion characterization have been developed, each with its own systematics and measurement dif?culties. A new way to measure charge diffusion using an X-ray source is presented. We demonstrate the effectiveness and limitations of our technique.
Czech name
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Czech description
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Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BN - Astronomy and celestial mechanics, astrophysics
OECD FORD branch
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Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical
Nuclear Instruments & Methods in Physics Research Section A
ISSN
0168-9002
e-ISSN
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Volume of the periodical
695
Issue of the periodical within the volume
Dec
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
2
Pages from-to
296-297
UT code for WoS article
000311469900065
EID of the result in the Scopus database
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