Charge diffusion measurement in fully depleted CCD using 55Fe X-rays

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F12%3A00387925" target="_blank" >RIV/68378271:_____/12:00387925 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1117/12.921327" target="_blank" >http://dx.doi.org/10.1117/12.921327</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1117/12.921327" target="_blank" >10.1117/12.921327</a>

Result language
angličtina
Original language name
Charge diffusion measurement in fully depleted CCD using 55Fe X-rays
Original language description
Tight requirements on the Large Synoptic Survey Telescope point spread function (PSF) demand sensor contribution to PSF be both small and well characterized. The sensor PSF is determined by the lateral charge diffusion on the drift path from the photon conversion point to the gates. The maximum drift path occurs for photons converted at the window, for blue optical photons in particular. Charges generated at the window surface undergo "worst case" charge spreading and the blue optical PSF is used to characterize the sensor's PSF. Different techniques for charge diffusion characterization have been developed, each with its own systematics and measurement difficulties. A new way to measure charge diffusion using an X-ray source is presented.
Czech name
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Czech description
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Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
High Energy, Optical, and Infrared Detectors for Astronomy V
ISBN
9780819491541
ISSN
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e-ISSN
—
Number of pages
6
Pages from-to
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Publisher name
SPIE
Place of publication
Bellingham
Event location
Amsterdam
Event date
Jul 1, 2012
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000313678800037

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