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Application of sum rule to the dispersion model of hydrogenated amorphous silicon

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F13%3A00424878" target="_blank" >RIV/68378271:_____/13:00424878 - isvavai.cz</a>

  • Alternative codes found

    RIV/00216224:14740/13:00071631

  • Result on the web

    <a href="http://dx.doi.org/10.1016/j.tsf.2013.04.012" target="_blank" >http://dx.doi.org/10.1016/j.tsf.2013.04.012</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1016/j.tsf.2013.04.012" target="_blank" >10.1016/j.tsf.2013.04.012</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Application of sum rule to the dispersion model of hydrogenated amorphous silicon

  • Original language description

    Optical data obtained for a-Si:H films by ellipsometry and spectrophotometry in the wide photon energy range 0.046?8.9 eV are fitted using the analytical dispersion models based on the application of the sum rule. The models include all absorption processes ranging from phonon absorption in IR region to core electron excitations in X-ray region. They take into account the existence of extended and localized states of valence electrons and distinguish transitions to conduction band and higher energy electron states.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2013

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Thin Solid Films

  • ISSN

    0040-6090

  • e-ISSN

  • Volume of the periodical

    539

  • Issue of the periodical within the volume

    JUL

  • Country of publishing house

    CH - SWITZERLAND

  • Number of pages

    12

  • Pages from-to

    233-244

  • UT code for WoS article

    000321111100039

  • EID of the result in the Scopus database