Fluence thresholds for grazing incidence hard x-ray mirrors

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F15%3A00449053" target="_blank" >RIV/68378271:_____/15:00449053 - isvavai.cz</a>

Result on the web

<a href="http://dx.doi.org/10.1063/1.4922380" target="_blank" >http://dx.doi.org/10.1063/1.4922380</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1063/1.4922380" target="_blank" >10.1063/1.4922380</a>

Result language

angličtina

Original language name

Fluence thresholds for grazing incidence hard x-ray mirrors

Original language description

X-ray Free Electron Lasers (XFEL) have the potential to contribute to many fields of science and to enable many new avenues of research, in large part due to their orders of magnitude higher peak brilliance than existing and future synchrotrons. To bestexploit this peak brilliance, these XFEL beams need to be focused to appropriate spot sizes. However, the survivability of X-ray optical components in these intense, femtosecond radiation conditions is not guaranteed. As mirror optics are routinely usedat XFEL facilities, a physical understanding of the interaction between intense X-ray pulses and grazing incidence X-ray optics is desirable. We conducted single shot damage threshold fluence measurements on grazing incidence X-ray optics, with coatingsof ruthenium and boron carbide, at the SPring-8 Angstrom compact free electron laser facility using 7 and 12 keV photon energies. The damage threshold dose limits were found to be orders of magnitude higher than would naively be expected.

Czech name

—

Czech description

—

Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BH - Optics, masers and lasers

OECD FORD branch

—

Project

<a href="/en/project/GA14-29772S" target="_blank" >GA14-29772S: Surface nanostructuring by extreme ultraviolet and X-ray laser radiation</a><br>

Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2015

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Applied Physics Letters

ISSN

0003-6951

e-ISSN

—

Volume of the periodical

106

Issue of the periodical within the volume

24

Country of publishing house

US - UNITED STATES

Number of pages

5

Pages from-to

"241905-1"-"241905-5"

UT code for WoS article

000356618700016

EID of the result in the Scopus database

2-s2.0-84934953871