Comparing single-shot damage thresholds of boron carbide and silicon at the European XFEL

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F24%3A00602980" target="_blank" >RIV/68378271:_____/24:00602980 - isvavai.cz</a>

Alternative codes found

RIV/61389021:_____/24:00617254 RIV/00216208:11320/24:10485628

Result on the web

<a href="https://hdl.handle.net/11104/0360257" target="_blank" >https://hdl.handle.net/11104/0360257</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1107/S1600577524007318" target="_blank" >10.1107/S1600577524007318</a>

Result language

angličtina

Original language name

Comparing single-shot damage thresholds of boron carbide and silicon at the European XFEL

Original language description

Xray free-electron lasers (XFELs) enable experiments that would have been impractical or impossible at conventional X-ray laser facilities. Indeed, more XFEL facilities are being built and planned, with their aim to deliver larger pulse energies and higher peak brilliance. While seeking to increase the pulse power, it is quintessential to consider the maximum pulse fluence that a grazing-incidence FEL mirror can withstand. To address this issue, several studies were conducted on grazing-incidence damage by soft X-ray FEL pulses at the European XFEL facility. Boron carbide (B4C) coatings on polished silicon substrate were investigated using 1 keV photon energy, similar to the X-ray mirrors currently installed at the soft X-ray beamlines (SASE3). The purpose of this study is to compare the damage threshold of B4C and Si to determine the advantages, tolerance and limits of using B4C coatings.

Czech name

—

Czech description

—

Type

J_imp - Article in a specialist periodical, which is included in the Web of Science database

CEP classification

—

OECD FORD branch

10305 - Fluids and plasma physics (including surface physics)

Project

<a href="/en/project/LM2023068" target="_blank" >LM2023068: Prague Asterix Laser System</a><br>

Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2024

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Journal of Synchrotron Radiation

ISSN

0909-0495

e-ISSN

1600-5775

Volume of the periodical

31

Issue of the periodical within the volume

5

Country of publishing house

GB - UNITED KINGDOM

Number of pages

4

Pages from-to

1067-1070

UT code for WoS article

001362324700009

EID of the result in the Scopus database

2-s2.0-85203195740