Attenuated total reflectance Fourier-transform infrared spectroscopic investigation of silicon heterojunction solar cells
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F15%3A00449313" target="_blank" >RIV/68378271:_____/15:00449313 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1063/1.4926749" target="_blank" >http://dx.doi.org/10.1063/1.4926749</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1063/1.4926749" target="_blank" >10.1063/1.4926749</a>
Alternative languages
Result language
angličtina
Original language name
Attenuated total reflectance Fourier-transform infrared spectroscopic investigation of silicon heterojunction solar cells
Original language description
Silicon heterojunction solar cells critically depend on the detailed properties of their amorphous/crystalline silicon interfaces. We report here on the use of attenuated total reflectance Fourier-transform infrared (ATR-FTIR) spectroscopy to gain precise insight into the vibrational properties of the surfaces and ultrathin layers present in such solar cells. We fabricate ATR prisms from standard silicon wafers similar to those used for device fabrication. In this fashion, we acquire very-high sensitivity FTIR information on device-relevant structures. Our method has no requirement for minimum layer thickness, enabling the study of the impact of the different fabrication process steps on the film microstructure. We discuss the necessary requirements for the method implementation and give a comprehensive overview of all observed vibration modes.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2015
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Review of Scientific Instruments
ISSN
0034-6748
e-ISSN
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Volume of the periodical
86
Issue of the periodical within the volume
7
Country of publishing house
US - UNITED STATES
Number of pages
6
Pages from-to
"073108-1"-"073108-6"
UT code for WoS article
000358934400019
EID of the result in the Scopus database
2-s2.0-84937500628