Far infrared and Raman response in tetragonal PZT ceramic films

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F15%3A00454637" target="_blank" >RIV/68378271:_____/15:00454637 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1016/j.bsecv.2015.11.003" target="_blank" >http://dx.doi.org/10.1016/j.bsecv.2015.11.003</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.bsecv.2015.11.003" target="_blank" >10.1016/j.bsecv.2015.11.003</a>

Result language
angličtina
Original language name
Far infrared and Raman response in tetragonal PZT ceramic films
Original language description
PbZr0.38Ti0.62O3 and PbZr0.36Ti0.64O3 thick films deposited by screen printing on (0001) single crystal sapphire substrates and prepared at two different sintering temperatures, were studied by Fourier-transform infrared reflectivity, time-domain THz transmission spectroscopy and micro-Raman spectroscopy. The dielectric response is discussed using the Lichtenecker model to account for the porosity of the films and to obtain the dense bulk dielectric functions. Results are compared with bulk tetragonal PZT 42/58 ceramics. The dynamic response in the films is dominated by an overdamped lead-based vibration in the THz range, as known in PZT, but its evaluated dielectric contribution is affected by the porosity and roughness of the surface.
Czech name
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Czech description
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Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Project
<a href="/en/project/GA14-25639S" target="_blank" >GA14-25639S: Tuning of terahertz response of dielectric materials and metamaterial structures</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2015
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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