Alternative Characterization Tool for Ferroelectric Polydomain Films
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F46747885%3A24220%2F09%3A%230001261" target="_blank" >RIV/46747885:24220/09:#0001261 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Alternative Characterization Tool for Ferroelectric Polydomain Films
Original language description
Advanced characterization techniques for ferroelectric ceramics and films play an essential role in successful applications of ferroelectric materials in devices. It is known that the presence of crystal lattice defects or electrode-adjacent non-ferroelectric (dead) layers badly deteriorate the dielectric properties of ferroelectric thin films. We propose a characterization technique for ferroelectric polydomain films, which is based on the analysis of the higher-order harmonics in the small-signal dielectric response of the film. Such information can then be used as a feedback for modifying the thin film processing and for tailoring their dielectric properties. Numerical estimates relevant to PZT films are provided.
Czech name
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Czech description
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Classification
Type
A - Audiovisual production
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2009
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
ISBN
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Place of publication
Xian, People's Republic of China
Publisher/client name
Electronic Materials Research Laboratory of Xi?an Jiaotong University, Xi'an 710049, People's Republic of China
Version
3
Carrier ID
IMF-ISAF-2009