Characterization of thin ferroelectric films using analysis of the polarization reversal kinetics: An application to P(VDF-TrFE) polymer films

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F46747885%3A24220%2F10%3A%230001734" target="_blank" >RIV/46747885:24220/10:#0001734 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Characterization of thin ferroelectric films using analysis of the polarization reversal kinetics: An application to P(VDF-TrFE) polymer films
Original language description
Advanced characterization techniques for ferroelectric thin films are important for successful application of ferroelectric materials in electronic devices. It is known that structural imperfections such as crystal lattice defects, grain boundaries or electrode-adjacent non-ferroelectric (dead) layers can badly deteriorate the dielectric response. We analyze the polarization reversal kinetics in systems with dead layers. We present the analysis of the experimental data within the conventional Kolmogorov-Avrami switching scenario and the exponential law for the field dependence of the domain wall velocity. In addition, we present a general characterization method for ferroelectric thin films, which is applicable to systems with the switching kinetics ofa general type.
Czech name
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Czech description
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Project
<a href="/en/project/GAP204%2F10%2F0616" target="_blank" >GAP204/10/0616: Modern piezoelectric perovskites: lattice vibrations and domain walls</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2010
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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