All
All

What are you looking for?

All
Projects
Organizations

Quick search

  • Projects supported by TA ČR
  • Excellent projects
  • Projects with the highest public support
  • Current projects

Smart search

  • That is how I find a specific +word
  • That is how I leave the -word out of the results
  • “That is how I can find the whole phrase”

Characterization of thin ferroelectric films using analysis of the polarization reversal kinetics: An application to P(VDF-TrFE) polymer films

Result description

Advanced characterization techniques for ferroelectric thin films are important for successful application of ferroelectric materials in electronic devices. It is known that structural imperfections such as crystal lattice defects, grain boundaries or electrode-adjacent non-ferroelectric (dead) layers can badly deteriorate the dielectric response. We analyze the polarization reversal kinetics in systems with dead layers. We present the analysis of the experimental data within the conventional Kolmogorov-Avrami switching scenario and the exponential law for the field dependence of the domain wall velocity. In addition, we present a general characterization method for ferroelectric thin films, which is applicable to systems with the switching kinetics ofa general type.

Keywords

Ferroelectric polymerPVDFSwitching kineticsDielectric characterizationFerroelectric domains

The result's identifiers

Alternative languages

  • Result language

    angličtina

  • Original language name

    Characterization of thin ferroelectric films using analysis of the polarization reversal kinetics: An application to P(VDF-TrFE) polymer films

  • Original language description

    Advanced characterization techniques for ferroelectric thin films are important for successful application of ferroelectric materials in electronic devices. It is known that structural imperfections such as crystal lattice defects, grain boundaries or electrode-adjacent non-ferroelectric (dead) layers can badly deteriorate the dielectric response. We analyze the polarization reversal kinetics in systems with dead layers. We present the analysis of the experimental data within the conventional Kolmogorov-Avrami switching scenario and the exponential law for the field dependence of the domain wall velocity. In addition, we present a general characterization method for ferroelectric thin films, which is applicable to systems with the switching kinetics ofa general type.

  • Czech name

  • Czech description

Classification

  • Type

    A - Audiovisual production

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

Others

  • Publication year

    2010

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • ISBN

  • Place of publication

    Edinburgh, SCOTLAND, AUG 09-12, 2010

  • Publisher/client name

    Heriot-Watt University, Edinburgh, Scotland, UK EH14 4AS

  • Version

  • Carrier ID

    ISAF-ECAPD-2010

Basic information

Result type

A - Audiovisual production

A

CEP

BM - Solid-state physics and magnetism

Year of implementation

2010