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Study of Yb?doped CoSb3 thermoelectric thin films prepared by laser

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F15%3A00456355" target="_blank" >RIV/68378271:_____/15:00456355 - isvavai.cz</a>

  • Alternative codes found

    RIV/61389013:_____/15:00456355

  • Result on the web

    <a href="http://dx.doi.org/10.4028/www.scientific.net/AMM.749.46" target="_blank" >http://dx.doi.org/10.4028/www.scientific.net/AMM.749.46</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.4028/www.scientific.net/AMM.749.46" target="_blank" >10.4028/www.scientific.net/AMM.749.46</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Study of Yb?doped CoSb3 thermoelectric thin films prepared by laser

  • Original language description

    Thin films of Yb filled CoSb3 were prepared on fused silica substrates using pulsed laser deposition method. The stoichiometric Yb0,19Co4Sb12 target was prepared by hot pressing method. The deposition conditions were changed with the goal to reach layersof smooth morphology. The target-to substrate distance was kept equal to 4 cm. The ambient argon pressure moved from 0.5 Pa to 13 Pa, laser repetition rate from 3 Hz to 10 Hz, and substrate temperature from 250 °C to 400 °C. We tested laser fluencies from 0.8 Jcm-2 to 5 Jcm-2. Films roughness was determined by mechanical profilometer and by atomic force microscopy. The lowest roughness of about 5 nm ? 10 nm was reached for low laser fluencies but mechanical quality of films was poor and growth rate low(about 0.1 A/pulse). From WDX analysis follows that there is an excess of Yb and Sb compared to Yb0,19Co4Sb12 target.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/GA13-33056S" target="_blank" >GA13-33056S: Characterization of thin thermoelectric layers and mutilayered structures by scanning thermal microscope and Harman method.</a><br>

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2015

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Applied Mechanics and Materials

  • ISBN

    978-3-03835-445-1

  • ISSN

  • e-ISSN

  • Number of pages

    5

  • Pages from-to

    46-50

  • Publisher name

    Trans Tech Publications

  • Place of publication

    Pfaffikon

  • Event location

    Phuket Island

  • Event date

    Jan 16, 2015

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article