Thermoelectric nanocrystalline YbCoSb laser prepared layers
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F16%3A00470066" target="_blank" >RIV/68378271:_____/16:00470066 - isvavai.cz</a>
Alternative codes found
RIV/61389013:_____/16:00470066 RIV/68407700:21460/16:00303853
Result on the web
<a href="http://dx.doi.org/10.1007/s00339-016-9685-7" target="_blank" >http://dx.doi.org/10.1007/s00339-016-9685-7</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1007/s00339-016-9685-7" target="_blank" >10.1007/s00339-016-9685-7</a>
Alternative languages
Result language
angličtina
Original language name
Thermoelectric nanocrystalline YbCoSb laser prepared layers
Original language description
Filled thermoelectric YbxCo4Sb12 layers were prepared by pulsed laser deposition method. The Yb0.19Co4Sb12 target was fabricated by hot pressing. Various deposition conditions were tested: target-substrate distance d(T-S) (4 or 6 cm), ambient argon pressure (from 0.5 to 13 Pa), laser repetition rate (from 3 to 10 Hz), substrate temperature (from 250 to 400 degrees C) and laser fluence (in region from 0.8 to 5 J cm(-2)). Film roughness was determined by mechanical profilometer and by AFM. For d(T-S) = 4 cm we observed a deficit of Yb and surplus of Co. Sb was transferred from target to film roughly stoichiometrically (as measured by EDX). Films created at 0.8 J cm(-2) exhibited generally poor stoichiometry and mechanical properties. Optimal conditions and stoichiometric transport were found for d(T-S) = 6 cm and 13 Pa of Ar. XRD shows that the films were nanocrystalline with CoSb3 structure. Grain size was in the range of similar to 50-80 nm.
Czech name
—
Czech description
—
Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
—
Result continuities
Project
<a href="/en/project/GA13-33056S" target="_blank" >GA13-33056S: Characterization of thin thermoelectric layers and mutilayered structures by scanning thermal microscope and Harman method.</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2016
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Applied Physics A - Materials Science & Processing
ISSN
0947-8396
e-ISSN
—
Volume of the periodical
122
Issue of the periodical within the volume
3
Country of publishing house
DE - GERMANY
Number of pages
5
Pages from-to
—
UT code for WoS article
000371041700014
EID of the result in the Scopus database
2-s2.0-85007236144