Comparison of silicon nanocrystals prepared by two fundamentally different methods

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F16%3A00470789" target="_blank" >RIV/68378271:_____/16:00470789 - isvavai.cz</a>

Result on the web

<a href="http://dx.doi.org/10.1186/s11671-016-1655-7" target="_blank" >http://dx.doi.org/10.1186/s11671-016-1655-7</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1186/s11671-016-1655-7" target="_blank" >10.1186/s11671-016-1655-7</a>

Result language

angličtina

Original language name

Comparison of silicon nanocrystals prepared by two fundamentally different methods

Original language description

This work compares structural and optical properties of silicon nanocrystals prepared by two fundamentally different methods, namely, electrochemical etching of Si wafers and low-pressure plasma synthesis, completed with a mechano-photo-chemical treatment. This treatment leads to surface passivation of the nanoparticles by methyl groups. Plasma synthesis unlike electrochemical etching allows selecting of the particle sizes. Measured sizes of the nanoparticles by dynamic light scattering show 3 and 20 nm for electrochemically etched and plasma-synthetized samples, respectively. Plasma-synthetized 20-nm particles do not exhibit photoluminescence due to absence of quantum confinement effect, and freshly appeared photoluminescence after surface passivation could indicate presence of organic molecules on the nanoparticle surface, luminescing instead of nanocrystal core. Electrochemically etched sample exhibits dramatic changes in photoluminescence during the mechano-photochemical treatment while no photoluminescence is observed for the plasma-synthetized one. We also used the Fourier transform infrared spectroscopy for comparison of the chemical changes happened during the treatment.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

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Project

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Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2016

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Nanoscale Research Letters

ISSN

1556-276X

e-ISSN

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Volume of the periodical

11

Issue of the periodical within the volume

Oct

Country of publishing house

US - UNITED STATES

Number of pages

7

Pages from-to

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UT code for WoS article

000391794100003

EID of the result in the Scopus database

2-s2.0-84989295918