Comparison of Silicon Nanocrystals Prepared by Two Fundamentally Different Methods
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F16%3A00304178" target="_blank" >RIV/68407700:21230/16:00304178 - isvavai.cz</a>
Result on the web
<a href="https://nanoscalereslett.springeropen.com/articles/10.1186/s11671-016-1655-7" target="_blank" >https://nanoscalereslett.springeropen.com/articles/10.1186/s11671-016-1655-7</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1186/s11671-016-1655-7" target="_blank" >10.1186/s11671-016-1655-7</a>
Alternative languages
Result language
angličtina
Original language name
Comparison of Silicon Nanocrystals Prepared by Two Fundamentally Different Methods
Original language description
This work compares structural and optical properties of silicon nanocrystals prepared by two fundamentally different methods, namely, electrochemical etching of Si wafers and low-pressure plasma synthesis, completed with a mechano-photo-chemical treatment. This treatment leads to surface passivation of the nanoparticles by methyl groups. Plasma synthesis unlike electrochemical etching allows selecting of the particle sizes. Measured sizes of the nanoparticles by dynamic light scattering show 3 and 20 nm for electrochemically etched and plasma-synthetized samples, respectively. Electrochemically etched sample exhibits dramatic changes in photoluminescence during the mechano-photo-chemical treatment while no photoluminescence is observed for the plasma-synthetized one. We also used the Fourier transform infrared spectroscopy for comparison of the chemical changes happened during the treatment.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
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Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2016
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Nanoscale Research Letters
ISSN
1931-7573
e-ISSN
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Volume of the periodical
11
Issue of the periodical within the volume
10
Country of publishing house
US - UNITED STATES
Number of pages
445
Pages from-to
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UT code for WoS article
000391794100003
EID of the result in the Scopus database
2-s2.0-84989295918