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Comparison of Silicon Nanocrystals Prepared by Two Fundamentally Different Methods

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F16%3A00304178" target="_blank" >RIV/68407700:21230/16:00304178 - isvavai.cz</a>

  • Result on the web

    <a href="https://nanoscalereslett.springeropen.com/articles/10.1186/s11671-016-1655-7" target="_blank" >https://nanoscalereslett.springeropen.com/articles/10.1186/s11671-016-1655-7</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1186/s11671-016-1655-7" target="_blank" >10.1186/s11671-016-1655-7</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Comparison of Silicon Nanocrystals Prepared by Two Fundamentally Different Methods

  • Original language description

    This work compares structural and optical properties of silicon nanocrystals prepared by two fundamentally different methods, namely, electrochemical etching of Si wafers and low-pressure plasma synthesis, completed with a mechano-photo-chemical treatment. This treatment leads to surface passivation of the nanoparticles by methyl groups. Plasma synthesis unlike electrochemical etching allows selecting of the particle sizes. Measured sizes of the nanoparticles by dynamic light scattering show 3 and 20 nm for electrochemically etched and plasma-synthetized samples, respectively. Electrochemically etched sample exhibits dramatic changes in photoluminescence during the mechano-photo-chemical treatment while no photoluminescence is observed for the plasma-synthetized one. We also used the Fourier transform infrared spectroscopy for comparison of the chemical changes happened during the treatment.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2016

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Nanoscale Research Letters

  • ISSN

    1931-7573

  • e-ISSN

  • Volume of the periodical

    11

  • Issue of the periodical within the volume

    10

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    445

  • Pages from-to

  • UT code for WoS article

    000391794100003

  • EID of the result in the Scopus database

    2-s2.0-84989295918