Combining ray tracing with device modeling to evaluate experiments for an optical analysis of crystalline Si solar cells and modules

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F17%3A00487360" target="_blank" >RIV/68378271:_____/17:00487360 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1016/j.egypro.2017.09.269" target="_blank" >http://dx.doi.org/10.1016/j.egypro.2017.09.269</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.egypro.2017.09.269" target="_blank" >10.1016/j.egypro.2017.09.269</a>

Result language
angličtina
Original language name
Combining ray tracing with device modeling to evaluate experiments for an optical analysis of crystalline Si solar cells and modules
Original language description
This paper develops a procedure to analyse the optical losses of both crystalline Si cells in air and of modules. We evaluate EQE and reflectance (R) measurements on the cell, and R measurements of the module by combining ray tracer from PV Lighthouse with Sentaurus device modeling. The IQE is the product of absorptance in Si due to e-h pair generation and their collection efficiency. With Sentaurus device modeling of our PERC cells, we can model collection to high precision and compute the IQE. The experiments agree well with modeling and we gain insight into the electric properties of the emitter in unprecedented detail. In the module, we reproduce the R measurements with the ray tracer and obtain R at the backsheet and the ribbon by iteration and evaluate their Lambertian factor by consistency. The ray tracing model, based on these measurements and with the achieved consistencies, then gives us an optical loss analysis of all parts of the cell and module.n
Czech name
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Czech description
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Project
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Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2017
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Energy Procedia. Proceedings of International Conference on Silicon Photovoltaics /7./
ISBN
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ISSN
1876-6102
e-ISSN
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Number of pages
10
Pages from-to
240-249
Publisher name
Elsevier Ltd
Place of publication
Amsterdam
Event location
Freiburg
Event date
Apr 3, 2017
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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