Kelvin probe force microscopy and calculation of charge transport in a graphene/silicon dioxide system at different relative humidity
Result description
The article shows how the dynamic mapping ofsurface potential (SP) measured by Kelvin probe forcemicroscopy (KPFM) in combination with calculation by adiffusion-like equation and the theory based on the Brunauer−Emmett−Teller (BET) model of water condensation andelectron hopping can provide the information concerning theresistivity of low conductive surfaces and their water coverage.This is enabled by a study of charge transport between isolatedand grounded graphene sheets on a silicon dioxide surface atdifferent relative humidity (RH) with regard to the use of graphene in ambient electronic circuits and especially in sensors. In theexperimental part, the chemical vapor-deposited graphene is precisely patterned by the mechanical atomic force microscopy(AFM) lithography and the charge transport is studied through a surface potential evolution measured by KPFM.
Keywords
The result's identifiers
Result code in IS VaVaI
Alternative codes found
RIV/00216305:26620/18:PU127833 RIV/70883521:28110/18:63520423
Result on the web
DOI - Digital Object Identifier
Alternative languages
Result language
angličtina
Original language name
Kelvin probe force microscopy and calculation of charge transport in a graphene/silicon dioxide system at different relative humidity
Original language description
The article shows how the dynamic mapping ofsurface potential (SP) measured by Kelvin probe forcemicroscopy (KPFM) in combination with calculation by adiffusion-like equation and the theory based on the Brunauer−Emmett−Teller (BET) model of water condensation andelectron hopping can provide the information concerning theresistivity of low conductive surfaces and their water coverage.This is enabled by a study of charge transport between isolatedand grounded graphene sheets on a silicon dioxide surface atdifferent relative humidity (RH) with regard to the use of graphene in ambient electronic circuits and especially in sensors. In theexperimental part, the chemical vapor-deposited graphene is precisely patterned by the mechanical atomic force microscopy(AFM) lithography and the charge transport is studied through a surface potential evolution measured by KPFM.
Czech name
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Czech description
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Classification
Type
Jimp - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
—
OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)
Result continuities
Project
—
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2018
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
ACS Applied Materials and Interfaces
ISSN
1944-8244
e-ISSN
—
Volume of the periodical
10
Issue of the periodical within the volume
14
Country of publishing house
US - UNITED STATES
Number of pages
8
Pages from-to
11987-11994
UT code for WoS article
000430156000068
EID of the result in the Scopus database
2-s2.0-85045341032
Result type
Jimp - Article in a specialist periodical, which is included in the Web of Science database
OECD FORD
Condensed matter physics (including formerly solid state physics, supercond.)
Year of implementation
2018