Optical contrast and raman spectroscopy techniques applied to few-layer 2d hexagonal boron nitride
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F19%3A00517722" target="_blank" >RIV/68378271:_____/19:00517722 - isvavai.cz</a>
Result on the web
<a href="http://hdl.handle.net/11104/0303013" target="_blank" >http://hdl.handle.net/11104/0303013</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.3390/nano9071047" target="_blank" >10.3390/nano9071047</a>
Alternative languages
Result language
angličtina
Original language name
Optical contrast and raman spectroscopy techniques applied to few-layer 2d hexagonal boron nitride
Original language description
The successful integration of few-layer thick hexagonal boron nitride (hBN) into devices based on two-dimensional materials requires fast and non-destructive techniques to quantify their thickness. Optical contrast methods and Raman spectroscopy have been widely used to estimate the thickness of two-dimensional semiconductors and semi-metals. However, they have so far not been applied to two-dimensional insulators. In this work, we demonstrate the ability of optical contrast techniques to estimate the thickness of few-layer hBN on SiO2/Si substrates, which was also measured by atomic force microscopy. Optical contrast of hBN on SiO2/Si substrates exhibits a linear trend with the number of hBN monolayers in the few-layer thickness range. We also used bandpass filters (500–650 nm) to improve the effectiveness of the optical contrast methods for thickness estimations.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2019
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Nanomaterials
ISSN
2079-4991
e-ISSN
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Volume of the periodical
9
Issue of the periodical within the volume
7
Country of publishing house
CH - SWITZERLAND
Number of pages
10
Pages from-to
1-10
UT code for WoS article
000478992600135
EID of the result in the Scopus database
2-s2.0-85073282934