AFM-IN-SEM ANALYSIS ON HETEROSTRUCTURE EDGES OF GRAPHENE AND HEXAGONAL BORON NITRIDE

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F24%3A00375620" target="_blank" >RIV/68407700:21230/24:00375620 - isvavai.cz</a>
Result on the web
<a href="https://doi.org/10.37904/nanocon.2023.4810" target="_blank" >https://doi.org/10.37904/nanocon.2023.4810</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.37904/nanocon.2023.4810" target="_blank" >10.37904/nanocon.2023.4810</a>

Result language
angličtina
Original language name
AFM-IN-SEM ANALYSIS ON HETEROSTRUCTURE EDGES OF GRAPHENE AND HEXAGONAL BORON NITRIDE
Original language description
Correlative microscopy methods have become significant due to the possibility of examining several material properties during one measurement. Atomic Force Microscopy in Scanning Electron Microscopy (AFM-in-SEM) is a correlative method that allows the simultaneous detection and acquisition of signals from both methods. Heterostructures of Graphene and hexagonal Boron Nitride (G/hBN) are studied with view to many electronic applications due to the possibility of tuning their electronic properties. In this work, we study electronic properties at the edges of single layer G on hBN flakes of various thicknesses prepared on Si and SiO2 substrates. Electronic properties are studied by AFM-in-SEM correlative microscopy that provides simultaneous acquisition of signals from both methods. Images of G/hBN heterostructure flakes obtained in the secondary electron detector show an enhanced signal along the edges that is attributed to localized electrons. We discuss how it corroborates a model that enhanced Raman signal of 2D and Si peaks on the G/hBN edges is electronic (plasmonic) rather than an optical or structural effect.
Czech name
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Czech description
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Project
<a href="/en/project/TM03000033" target="_blank" >TM03000033: TACOM - Development of correlative AFM and SEM/AirSEM microscope</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2024
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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