Real and imaginary permittivity measured by thermal noise dielectric spectroscopy

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F22%3A00559990" target="_blank" >RIV/68378271:_____/22:00559990 - isvavai.cz</a>

Result on the web

<a href="https://doi.org/10.1063/5.0084805" target="_blank" >https://doi.org/10.1063/5.0084805</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1063/5.0084805" target="_blank" >10.1063/5.0084805</a>

Result language

angličtina

Original language name

Real and imaginary permittivity measured by thermal noise dielectric spectroscopy

Original language description

This paper demonstrates that both real and imaginary parts of dielectric permittivity in a kHz frequency range can be determined from the thermal noise voltage spectra. The proposed method, termed as thermal noise dielectric spectroscopy, relies on the set of calibration measurements of gauge resistors and capacitors. This method has a great potential for investigations of strongly nonlinear dielectric materials whenever the initial permittivity is of interest because the thermal noise method probes the permittivity by an almost zero electric field. Here, we tested this method by measuring dielectric spectra of 100 nm thin film of paraelectric SrTiO3 in a thermal noise setup in which the film is effectively probed by voltages of the order of nanovolts. For the sake of comparison, the permittivity of the same SrTiO3 thin film has been also measured using the standard impedance analyzer with the probing AC voltage of 10 mV.

Czech name

—

Czech description

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Type

J_imp - Article in a specialist periodical, which is included in the Web of Science database

CEP classification

—

OECD FORD branch

10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Project

Result was created during the realization of more than one project. More information in the Projects tab.

Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2022

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Journal of Applied Physics

ISSN

0021-8979

e-ISSN

1089-7550

Volume of the periodical

131

Issue of the periodical within the volume

21

Country of publishing house

US - UNITED STATES

Number of pages

6

Pages from-to

214101

UT code for WoS article

000850284100001

EID of the result in the Scopus database

2-s2.0-85131335496