An electrode-free method of characterizing the microwave dielectric properties of high-permittivity thin films

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F11%3A00374373" target="_blank" >RIV/68378271:_____/11:00374373 - isvavai.cz</a>

Result on the web

<a href="http://dx.doi.org/10.1063/1.3537835" target="_blank" >http://dx.doi.org/10.1063/1.3537835</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1063/1.3537835" target="_blank" >10.1063/1.3537835</a>

Result language

angličtina

Original language name

An electrode-free method of characterizing the microwave dielectric properties of high-permittivity thin films

Original language description

A thin dielectric resonator consisting of a dielectric substrate and the thin film deposited upon it is proposed for microwave characterization and dielectric parameter measurement of high-permittivity thin films without electrodes. Ultra-thin strained EuTiO3 films on LSAT and DyScO3 substrates were characterized.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

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Project

<a href="/en/project/GA202%2F09%2F0682" target="_blank" >GA202/09/0682: Dielectric spectroscopy and lattice dynamics of magnetoelectric multiferroics and strained ferroelectric thin films</a><br>

Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2011

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Journal of Applied Physics

ISSN

0021-8979

e-ISSN

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Volume of the periodical

109

Issue of the periodical within the volume

2

Country of publishing house

US - UNITED STATES

Number of pages

6

Pages from-to

"024106/1"-"024106/6"

UT code for WoS article

000286896400079

EID of the result in the Scopus database

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