Thin dielectric resonators for microwave characterization of films and substrates
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F11%3A00368068" target="_blank" >RIV/68378271:_____/11:00368068 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Thin dielectric resonators for microwave characterization of films and substrates
Original language description
Thin dielectric resonator consisting only of the low-loss dielectric substrate and deposited film is proposed for the electrode-free microwave characterization of thin films and substrates. In-plane microwave dielectric parameters of a number of substrates and thin films were measured in a broad temperature range using the TE01? resonance mode. Dielectric anomalies corresponding to the induced phase transitions were observed. The HE11? mode is proposed for the in-plane dielectric anisotropy characterization. The anisotropy of the (110) DyScO3 substrate was measured.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Microwave and Telecommunication Technology (CriMiCo) 2011. 21th International Crimean Conference
ISBN
978-966-335-351-7
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
620-621
Publisher name
Veber
Place of publication
Sevastopol
Event location
Sevastopol
Event date
Sep 12, 2011
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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