Generation of uniform X-ray illumination and its application to X-ray diffraction microscopy
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F22%3A00568858" target="_blank" >RIV/68378271:_____/22:00568858 - isvavai.cz</a>
Result on the web
<a href="https://hdl.handle.net/11104/0340130" target="_blank" >https://hdl.handle.net/11104/0340130</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.3390/photonics9120934" target="_blank" >10.3390/photonics9120934</a>
Alternative languages
Result language
angličtina
Original language name
Generation of uniform X-ray illumination and its application to X-ray diffraction microscopy
Original language description
X-ray diffraction microscopy (XDM) is an established lens-less imaging method extensively practiced at synchrotrons and X-ray free-electron lasers (XFELs). XDM is broadly operated in two different modes: scanning and non-scanning. The non-scanning mode of operation in XDM is commonly called coherent diffraction imaging (CDI) and has been the key research direction of many XFEL facilities. This method typically images objects smaller than the size of the illumination, which precludes the imaging of a large group of samples physically larger than the illumination. Furthermore, satisfying this requirement at X-ray free-electron lasers tremendously reduces the volume of practically useful data, leading the experimental scheme to be less efficient. Such a limitation can be circumvented by using a uniform illumination probe rather than the traditional Gaussian-focused probe from the X-ray focusing optics.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10303 - Particles and field physics
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2022
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Photonics
ISSN
2304-6732
e-ISSN
2304-6732
Volume of the periodical
9
Issue of the periodical within the volume
12
Country of publishing house
CH - SWITZERLAND
Number of pages
10
Pages from-to
934
UT code for WoS article
000904526200001
EID of the result in the Scopus database
2-s2.0-85144698513