Damage threshold of LiF crystal irradiated by femtosecond hard XFEL pulse sequence
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F23%3A00573902" target="_blank" >RIV/68378271:_____/23:00573902 - isvavai.cz</a>
Result on the web
<a href="https://hdl.handle.net/11104/0344294" target="_blank" >https://hdl.handle.net/11104/0344294</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1364/OE.486868" target="_blank" >10.1364/OE.486868</a>
Alternative languages
Result language
angličtina
Original language name
Damage threshold of LiF crystal irradiated by femtosecond hard XFEL pulse sequence
Original language description
Here we demonstrate the results of investigating the damage threshold of a LiF crystal after irradiating it with a sequence of coherent femtosecond pulses using the European X-ray Free Electron Laser (EuXFEL). The laser fluxes on the crystal surface varied in the range ∼0.015–13 kJ/cm2 per pulse when irradiated with a sequence of 1-100 pulses (tpulse ∼20 fs, Eph = 9keV). Analysis of the surface of the irradiated crystal using different reading systems allowed the damage areas and the topology of the craters formed to be accurately determined. It was found that the ablation threshold decreases with increasing number of X-ray pulses, while the depth of the formed craters increases non-linearly and reaches several hundred nanometers. The obtained results have been compared with data already available in the literature for nano- and picosecond pulses from lasers in the soft X-ray/VUV and optical ranges.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10306 - Optics (including laser optics and quantum optics)
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2023
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Optics Express
ISSN
1094-4087
e-ISSN
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Volume of the periodical
31
Issue of the periodical within the volume
16
Country of publishing house
US - UNITED STATES
Number of pages
15
Pages from-to
26395
UT code for WoS article
001051220600004
EID of the result in the Scopus database
2-s2.0-85168315730