In-line thickness imaging tool and detail study of interdigitated back-contacts for silicon heterojunction solar cells

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F25%3A00617446" target="_blank" >RIV/68378271:_____/25:00617446 - isvavai.cz</a>
Result on the web
<a href="https://doi.org/10.1016/j.solmat.2025.113475" target="_blank" >https://doi.org/10.1016/j.solmat.2025.113475</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.solmat.2025.113475" target="_blank" >10.1016/j.solmat.2025.113475</a>

Result language
angličtina
Original language name
In-line thickness imaging tool and detail study of interdigitated back-contacts for silicon heterojunction solar cells
Original language description
Absorption of excitation light in silicon thin films reduces the photoluminescence signal of the underlying rough crystalline silicon substrate. We exploit this phenomenon to develop a contactless and fast imaging method for measuring the thickness of thin and ultra-thin films deposited on rough substrates. We test this technique on thin amorphous or microcrystalline silicon stripes deposited on rough silicon surfaces, a structure used in highefficiency silicon heterojunction solar cells. The AFM and UV Raman study revealed local inhomogeneities in film coverage and crystallinity, which could directly impact the final quality of the solar cell. For independent thickness verification, a precise but time-consuming Raman microspectroscopy-based measurement was employed. A newly developed fast photoluminescence imaging reduces the measurement time below 0.4 s while maintaining a thickness detection limit below 1 nm. This enables the use of this imaging method as an in-line characterization tool for interdigitated back-contact silicon photovoltaic production.
Czech name
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Czech description
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Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Project
<a href="/en/project/LM2023051" target="_blank" >LM2023051: Research infrastructure CzechNanoLab</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2025
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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