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Crystalline composition of silicon deposited on a low-cost substrate for photovoltaic applications studied by in-situ spectroscopic ellipsometry

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27350%2F14%3A86090889" target="_blank" >RIV/61989100:27350/14:86090889 - isvavai.cz</a>

  • Alternative codes found

    RIV/61989100:27740/14:86090889 RIV/61989100:27640/14:86090889

  • Result on the web

    <a href="http://dx.doi.org/10.1117/12.2176098" target="_blank" >http://dx.doi.org/10.1117/12.2176098</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1117/12.2176098" target="_blank" >10.1117/12.2176098</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Crystalline composition of silicon deposited on a low-cost substrate for photovoltaic applications studied by in-situ spectroscopic ellipsometry

  • Original language description

    This paper deals with the study of thin silicon films deposited by plasma-enhanced chemical vapor deposition on the industrial iron-nickel alloy substrate. This approach is promising for fabrication of low-cost high-efficiency solar cells. The main aim is to characterize the intrinsic hydrogenated microcrystalline silicon layer which fulfills its role of the absorber and has a direct impact on the solar cell performance. The real-time ellipsometric data obtained during the material deposition in the reactor are used to study the composition of the grown material. Based on the designed optical model, the evolution of the material crystallinity as well as the thickness and composition of the surface roughness layer are established in addition to an estimation of the average growth rate. Transmission electron microscopy was used to obtain the images of material structure and to verify conclusions of optical modeling.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    BH - Optics, masers and lasers

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/ED1.1.00%2F02.0070" target="_blank" >ED1.1.00/02.0070: IT4Innovations Centre of Excellence</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2014

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings of SPIE. Volume 9441

  • ISBN

    978-1-62841-556-8

  • ISSN

    0277-786X

  • e-ISSN

  • Number of pages

    6

  • Pages from-to

    "94411F"

  • Publisher name

    SPIE

  • Place of publication

    Bellingham

  • Event location

    Wojanow Palace

  • Event date

    Sep 8, 2014

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article

    000349332600050