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Tomography for XRDD

Result description

This work is devoted to the application of tomographic techniques for "X-ray dynamic defectoscopy" (XRDD). The XRDD method enables the on-line observation of material density variations with micrometric accuracy thanks to the good spatial resolution andsensitivity of the single X-ray photon counting pixel Medipix-1detector. The test specimen is illuminated by X-rays during the loading process. Measured changes in transmission represent effective alternations in the specimen thickness, which are understood as weakening of the material due to volume voids resulting from loading stress. Volume voids in the specimen are projected onto a single two dimensional image. Variation in void density along the beam can be determined by tomographic methods. This paper studies the applicability of tomographic techniques for XRDD and presents results of preliminary experiments

Keywords

RadiographyTomographySilicon pixel detector

The result's identifiers

Alternative languages

  • Result language

    angličtina

  • Original language name

    Tomography for XRDD

  • Original language description

    This work is devoted to the application of tomographic techniques for "X-ray dynamic defectoscopy" (XRDD). The XRDD method enables the on-line observation of material density variations with micrometric accuracy thanks to the good spatial resolution andsensitivity of the single X-ray photon counting pixel Medipix-1detector. The test specimen is illuminated by X-rays during the loading process. Measured changes in transmission represent effective alternations in the specimen thickness, which are understood as weakening of the material due to volume voids resulting from loading stress. Volume voids in the specimen are projected onto a single two dimensional image. Variation in void density along the beam can be determined by tomographic methods. This paper studies the applicability of tomographic techniques for XRDD and presents results of preliminary experiments

  • Czech name

    Využití tomografie pro XRDD

  • Czech description

    Tato práce je věnovaná použití tomografické techniky pro X-ray dynamickou defektoskopii (XRDD). Díky dobrému prostorovému rozlišení a citlivosti detektoru Medipix-1 jednotlivých X-fotonů umožňuje metoda XRDD online pozorování změn hustoty materiálu a tos mikrometrickou přesností. Testovaný vzorek je během zatěžovacího procesu prosvěcován X-zářením. Měřené rozdíly procházejícího záření představují efektivní změny tloušťky vzorku, které jsou brány jako oslabení materiálu objemovým zastoupením dutin, ježjsou důsledkem napjatosti vzorku. Objemový podíl dutin ve vzorku je projektován do dvojdimenzionálního obrázku. Změny v hustotě dutin podél svazku mohou být určeny tomograficky. V této práci je zkoumána použitelnost tomografických technik pro XRDD a jsouzde prezentovány první výsledky

Classification

  • Type

    Jx - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    JB - Sensors, detecting elements, measurement and regulation

  • OECD FORD branch

Others

  • Publication year

    2004

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Nuclear Instruments and Methods in Physics Research Section A

  • ISSN

    0168-9002

  • e-ISSN

  • Volume of the periodical

    531

  • Issue of the periodical within the volume

    2004

  • Country of publishing house

    NL - THE KINGDOM OF THE NETHERLANDS

  • Number of pages

    7

  • Pages from-to

    307-313

  • UT code for WoS article

  • EID of the result in the Scopus database

Result type

Jx - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

Jx

CEP

JB - Sensors, detecting elements, measurement and regulation

Year of implementation

2004