Modern Optoelectronic Methods for Non-Contact Deformation Measurement in Industry

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21110%2F02%3A01077781" target="_blank" >RIV/68407700:21110/02:01077781 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Modern Optoelectronic Methods for Non-Contact Deformation Measurement in Industry
Original language description
Two different types of optoelectronic method for non-contact deformation measurement are described: the ray method and the interferometric method. The work is focused on several theoretical and experimental aspects of evaluation of the deformations withthe ray method, especially on problems of measuring extended objects in engineering practice and automatic processes for evaluation of deformations. We also propose a technique for the smoothing of continuous optically rough surfaces to allow successfulapplication of the ray method for deformation measurement. In this work we describe a proposed optical method for measuring static deformations based on the interference of coherent wave fields and a phase shifting procedure. Detailed analysis of the measurement and evaluation process with respect to the most important measurement factors is performed
Czech name
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Czech description
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Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BH - Optics, masers and lasers
OECD FORD branch
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Project
<a href="/en/project/GA103%2F02%2F0357" target="_blank" >GA103/02/0357: Modern optoelectronic methods of measuring surfaces´topography</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2002
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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