All

What are you looking for?

All
Projects
Results
Organizations

Quick search

  • Projects supported by TA ČR
  • Excellent projects
  • Projects with the highest public support
  • Current projects

Smart search

  • That is how I find a specific +word
  • That is how I leave the -word out of the results
  • “That is how I can find the whole phrase”

Influence of Change of Imaging Conditions on Accuracy of Optical Measurement Systems

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21110%2F03%3A01088350" target="_blank" >RIV/68407700:21110/03:01088350 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Influence of Change of Imaging Conditions on Accuracy of Optical Measurement Systems

  • Original language description

    The work analyses an influence of the change of imaging conditions on the accuracy of optical and optoelectronic measurement systems, which are used in various industrial branches, e.g. in mechanical engineering, optical industry, building industry, etc.It is shown that in case of the change of position of the measured object the imaging properties of the used optical measurement instrument are changed. This position change affects the image quality. If some optical measurement system is aberration free for a specified position of the measured object, then for other object positions the optical system has aberrations. The consequence of this effect is the change of the measurement accuracy for the specific optical system. The described effect is not removable on principle and it is necessary to take account to it in high accuracy measurements

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    BH - Optics, masers and lasers

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/GA103%2F02%2F0357" target="_blank" >GA103/02/0357: Modern optoelectronic methods of measuring surfaces´topography</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2003

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    SPIE Proceedings, Vol. 5144

  • ISBN

    0-8194-5014-6

  • ISSN

  • e-ISSN

  • Number of pages

    5

  • Pages from-to

    801-805

  • Publisher name

    SPIE

  • Place of publication

    Washington

  • Event location

    Munich

  • Event date

    Jun 23, 2003

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article