Monte Carlo Simulation of Electron Interaction with a Thin Film

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21220%2F03%3A02088130" target="_blank" >RIV/68407700:21220/03:02088130 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Monte Carlo Simulation of Electron Interaction with a Thin Film

Original language description

A Monte Carlo simulation (MC)of medium energy electron transport in solids is usually checked, where possible, by comparing calculated values with experimental ones. Unfortunately, some quantities are very difficult to measure, even though it is important to know them for proper analytical measurement by electron probe microanalysis. One of the most important parameters is the dimensions of the volume at which the interaction of electrons with matter produces X-ray radiation.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BF - Elementary particle theory and high energy physics

OECD FORD branch

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Project

<a href="/en/project/GA202%2F02%2F0237" target="_blank" >GA202/02/0237: Electron transport processes near solid surfaces</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year

2003

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Thin Solid Films

ISSN

0040-6090

e-ISSN

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Volume of the periodical

433

Issue of the periodical within the volume

6

Country of publishing house

CH - SWITZERLAND

Number of pages

6

Pages from-to

326-331

UT code for WoS article

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EID of the result in the Scopus database

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