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Si and Gradient Layer Formed by RF PACVD Technology

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21220%2F11%3A00181099" target="_blank" >RIV/68407700:21220/11:00181099 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Si and Gradient Layer Formed by RF PACVD Technology

  • Original language description

    They were investigated Si layers (and gradient layer) formed by RF PACVD technology. Si layers are useful and very important intermediate layers before depositing DLC coatings. We reached different Si layers by RF PACVD technology from Hexamethyldisiloxane - HMDSO with various diluted supporting gas (Ar, H2, N2) and we have investigated their properties. To compare the characteristics of layers we prepared gradient film, which contents carbon of CH4. Mechanical behavior of the substrate - coating systems was determined by nanoindentation load - displacement curves. Results show that the diluted gas is remarkable parameter for the properties of the Si intermediate layers.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BL - Plasma physics and discharge through gases

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2011

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Výrobné inžinierstvo

  • ISSN

    1335-7972

  • e-ISSN

  • Volume of the periodical

    10

  • Issue of the periodical within the volume

    2

  • Country of publishing house

    SK - SLOVAKIA

  • Number of pages

    4

  • Pages from-to

    32-35

  • UT code for WoS article

  • EID of the result in the Scopus database