Nitrogen oversaturation in ion implanted titanium
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21220%2F18%3A00325679" target="_blank" >RIV/68407700:21220/18:00325679 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Nitrogen oversaturation in ion implanted titanium
Original language description
Commercially pure titanium grade 2 was implanted with 90 keV nitrogen ions with different fluences. X-ray diffraction analysis was performed to obtain a phase characterization. The surface morphology was investigated by scanning electron microscopy and atomic force microscopy, and the nitrogen depth distribution was measured by glow discharge optical emission spectroscopy. The formation of continuous TiN surface layer was observed. The dependence nitrogen concentration on the fluence showed a nitrogen saturation limit. Oversaturation caused the surface blistering. The highest applied fluence led to the sputtering of the blisters and the formation of cracks.
Czech name
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Czech description
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Classification
Type
O - Miscellaneous
CEP classification
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OECD FORD branch
20501 - Materials engineering
Result continuities
Project
<a href="/en/project/GA16-22276S" target="_blank" >GA16-22276S: Nitrogen doped titanium materials: A study of temperature-dependent doping in radiation-damaged matrix</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2018
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů