Intercomparison of Resistance Standards with Calculable Frequency Dependence for the Characterisation of Quantum Hall Devices

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F00%3A03060930" target="_blank" >RIV/68407700:21230/00:03060930 - isvavai.cz</a>

Alternative codes found

RIV/68407700:21230/00:03020930

Result on the web

—

DOI - Digital Object Identifier

—

Result language

angličtina

Original language name

Intercomparison of Resistance Standards with Calculable Frequency Dependence for the Characterisation of Quantum Hall Devices

Original language description

We have constructed ac/dc transfer resistance standards with nominal values of 12906.4 ohms. The resistors differ considerably since bifilar, quadrifilar, and octafilar units have been built. In addition the length of the quadrifilar units was varied.

Czech name

—

Czech description

—

Type

D - Article in proceedings

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

—

Project

<a href="/en/project/GA102%2F98%2F1571" target="_blank" >GA102/98/1571: Quantum Hall effect based calibration of capacitance standards</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year

2000

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

Conference on Precision Electromagnetic Measurements

ISBN

0-7803-5744-2

ISSN

—

e-ISSN

—

Number of pages

2

Pages from-to

—

Publisher name

IEEE

Place of publication

Sydney

Event location

—

Event date

—

Type of event by nationality

—

UT code for WoS article

—