Very Thin Layers Prepared By Laser Ablation From Bi2Te3 Target

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F04%3A03094835" target="_blank" >RIV/68407700:21230/04:03094835 - isvavai.cz</a>

Result on the web

—

DOI - Digital Object Identifier

—

Result language

angličtina

Original language name

Very Thin Layers Prepared By Laser Ablation From Bi2Te3 Target

Original language description

Transport properties are presented for 60nm thick layers which were prepared by the laser ablation from a Bi2Te3 target. The layers are deposited on quartz glass substrates. The energy density of the laser beam on the target is 2Jcm-2 and the temperatureof the substrate during deposition varies between (200-480°C) for different samples. The influence of the temperature of the substrate during the deposition on topography of layers measured by Scanning Tunnelling Microscope (STM) is presented.The BiTe and Bi2Te phases are detected by the X-ray Diffraction (XRD) method.

Czech name

Není k dispozici

Czech description

Není k dispozici

Type

D - Article in proceedings

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

—

Project

—

Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2004

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

Proceedings of 22nd International Conference on Thermoelectrics

ISBN

—

ISSN

—

e-ISSN

—

Number of pages

1

Pages from-to

1-1

Publisher name

IEEE Computer Society - TC on Test Technology

Place of publication

Montpellier

Event location

La Grande-Motte

Event date

Aug 17, 2003

Type of event by nationality

WRD - Celosvětová akce

UT code for WoS article

—