Dynamic Parameters Testing of 24-bit Resolution ADCs
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F04%3A03099706" target="_blank" >RIV/68407700:21230/04:03099706 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Dynamic Parameters Testing of 24-bit Resolution ADCs
Original language description
Effective number of bits (ENOB) and normality test of code word histogram of Micro-Converter ADUC824 with 24 bit ADC has been evaluated. The methodology and results are shown and discussed in the paper.
Czech name
Není k dispozici
Czech description
Není k dispozici
Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GP102%2F01%2FD087" target="_blank" >GP102/01/D087: New Methods of Digitizers Testing by means of Stochastic Signals</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2004
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
ICSES'04 International Conference on Signals and Electronic Systems
ISBN
83-906074-7-6
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
211-212
Publisher name
PTETiS
Place of publication
Poznaň
Event location
Poznan
Event date
Sep 13, 2004
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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