Influence of the Test Lengths on Area Overhead in Mixed-Mode BIST

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F04%3A03100099" target="_blank" >RIV/68407700:21230/04:03100099 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Influence of the Test Lengths on Area Overhead in Mixed-Mode BIST
Original language description
In this paper we present a discussion on choosing the test lengths in our mixed-mode BIST technique. The BIST design method is based on the column-matching algorithm proposed before. The mixed-mode strategy divides the test sequence into two disjoint phases: first the pseudo random phase detects the easy-to-detect faults, and the subsequent deterministic phase generates test vectors needed to fully test the circuit. The lengths of these two phases directly influence both the test time and the BIST areaoverhead, as well as the BIST design time. Some kind of trade-off has to be found, to design the BIST circuitry efficiently. The pseudo-random testability of the ISCAS benchmarks is studied here. The conclusions obtained here can be generalized to be applied to any circuit.
Czech name
Není k dispozici
Czech description
Není k dispozici

Project
<a href="/en/project/GA102%2F04%2F2137" target="_blank" >GA102/04/2137: Design of highly reliable control systems built on dynamically reconfigurable FPGAs.</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2004
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Proceedings of the 9th Biennial Baltic Electronics Conference
ISBN
9985-59-462-2
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
201-204
Publisher name
Tallinn Technical University
Place of publication
Tallinn
Event location
Tallinn
Event date
Oct 3, 2004
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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