Improvement of the Fault Coverage of the Pseudo-Random Phase in Column Matching BIST
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F05%3A03109880" target="_blank" >RIV/68407700:21230/05:03109880 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Improvement of the Fault Coverage of the Pseudo-Random Phase in Column Matching BIST
Original language description
Several methods improving the fault coverage in mixed mode BIST are presented in this paper. The test is divided into two phases: the pseudo-random and deterministic. Maximum of faults should be detected by the pseudo-random phase, to reduce the number of faults to be covered in the deterministic one. We study the properties of different pseudo-random pattern generators. Their successfulness in fault covering strictly depends on the tested circuit. We examine properties of LFSRs and cellular automata. Four methods enhancing the pseudo random fault coverage have been proposed. Then we propose a universal method to efficiently compute test weights. The observations are documented on some of the standard ISCAS benchmarks and the final BIST circuitry is synthesized using the Column-Matching method.
Czech name
Není k dispozici
Czech description
Není k dispozici
Classification
Type
D - Article in proceedings
CEP classification
JC - Computer hardware and software
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA102%2F04%2F2137" target="_blank" >GA102/04/2137: Design of highly reliable control systems built on dynamically reconfigurable FPGAs.</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2005
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proceedings Eighth EUROMICRO Conference on Digital System Design
ISBN
0-7695-2433-8
ISSN
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e-ISSN
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Number of pages
8
Pages from-to
56-63
Publisher name
IEEE Computer Society
Place of publication
Los Alamitos
Event location
Porto
Event date
Aug 30, 2005
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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