Pseudorandom Testability - Study of the Effect of the Generator Type

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F05%3A03109961" target="_blank" >RIV/68407700:21230/05:03109961 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Pseudorandom Testability - Study of the Effect of the Generator Type
Original language description
During a pseudo-random testing of combinational circuits the pattern generator produces test vectors that are being applied to the tested circuit. The nature of the generator thus directly influences the fault coverage achieved. We discuss an influence of the type of the pseudo-random pattern generator on the fault coverage. In most cases a linear feedback shift register (LFSR) is used as a test pattern generator, while its generating polynomial is primitive to ensure a maximal period. We show that it is not necessary to use primitive polynomials, and moreover that their using is even undesirable in most cases. The observations are documented by statistical results.
Czech name
Není k dispozici
Czech description
Není k dispozici

Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JC - Computer hardware and software
OECD FORD branch
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Project
<a href="/en/project/GA102%2F04%2F2137" target="_blank" >GA102/04/2137: Design of highly reliable control systems built on dynamically reconfigurable FPGAs.</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2005
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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